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半導體分立器件綜合測試儀 IST8800

廠家: 美國IST

說明書下載

本儀器是美國IST公司最新研制的產品(IST880的升級換代產品)，采用Z80芯片，微機控制，液晶顯示其測試條件及測量結果，可用于對晶體三極管，二極管，齊納二極管，J型場效應管，可控硅管。，三端雙向可控硅管和三端穩壓器進行直流參數的測試，并可自動進行合格/不合格判斷，對器件進行分選.本儀器并配有RS232C串聯接口和IEEE488接口，可配接電腦數據記錄儀及打印機，打印出測試條件及結果。并可以對各類器件的予置測試條件進行存儲。關機后，仍可保存在機內，以備下一次的使用。

IST8800提供了40種測量參數，它們分別為：

性能特點：

性能指標

三極管漏電流 Icbo  Iceo  Ices  Iebo  Icev
 電流 電壓 分辨率  誤差
0 - 200.0 nA 0 - 600V 0.1nA ±2%
0 - 200μA 0 - 600V 1 nA ±1.5%
0 - 200.0μA 0 - 600V 1.1μA ±1%
0 - 20.00mA 0 - 500V 10μA ±1%
三級管擊穿電壓 BVcbo BVebo BVcer BVces BVcev
電壓 電流 分辨率 誤差
0 - 600V 0 - 30mA 3V ±1%
0 - 30V 0 - 200mA 0.1V ±1%
三極管正向導通電壓 Vve(sat) Vbe(sat)
電壓 電流 分辨率 誤差
0 - 5V 0 - 5A  2mV ±2%
0 - 2V 0 - 1A 1mV ±2%
三極管電流增益 hFE
量程 分辨率 誤差
hFE 0 - 5000 1 ±2%
Vce 0 - 20V
Ic 0 - 5A
Ib 0 - 1A
二極管反向電流 Ir
電流 電壓 分辨率 誤差
0 - 200.0nA 0 - 600V 0.1nA ±2%
0 - 200.0μA 0 - 600V 1 nA ±1.5%
0 - 2.00μA 0 - 600V 0.1μA ±1%
0 - 20.00mA 0 - 500V 10μA ±1%
二極管反向擊穿電壓 BVr
C 電流 分辨率 誤差
0 - 30V 0 - 200mA  0.1V ±2%
0 - 600V 0 - 20mA 3V ±2%
二極管正向工作電壓 Vf
電壓 電流 分辨率 誤差
0 - 5V 0 - 5A 2mV ±2%
穩壓二極管 BVz
電壓 電流 分辨率 誤差
0 - 300V 0 30mA 1V ±1%
0 - 60V 0 200mA 0.3V ±1.5%
0 - 40V 0 - 1mA 0.1V ±1%
穩壓二極管 Izr
電流 電壓 分辨率 誤差
0 - 500mA 0 30V 2mA ±1%
0 - 100mA 0 60V 0.4mA ±1%
0 - 20mA 0 250V 80nA ±2.5%
 穩壓二極管 Vzr
電流 電壓 分辨率 誤差
0 - 300V 0 - 30mA 1V ±1%
0 - 60V 0 - 200mA 0.3V ±1.5%
0 - 40V  0 - 1A 0.1V ±1%
穩壓二極管 Vzf
電壓 電流 分辨率 誤差
0 - 5V 0 - 5A 2mv  ±1%
J/M型場效應管飽和漏源電流 Idss
電流 電壓 分辨率 誤差
0 - 0.2A 0 - 30V 10μA ±2%
0 - 30mA 0 - 300V  1μA ±2%
J型場效應管柵極漏電流 Igss
電流 電壓 分辨率 誤差
0 - 20.00mA 0 - 30V 10μA ±2%
0 - 200.0μA 0 - 30V 0.1μA ±1.5%
0 - 2.00μA 0 - 30V 1nA ±1.5%
0 - 200.0nA 0 - 30V 0.1nA ±1.5%
J型場效應管柵極電壓 BVgss
電壓 電流 分辨率  誤差
0 - 300V 0 - 30mA 1v ±2%
0 - 30V 0 - 200mA  0.2v ±1.5%
可控硅整流器件及雙向可控硅開關器件 Vgt(可控硅和三端雙向可控硅觸發電壓) Igt(觸發電流)
電流 電壓 分辨率 誤差
0 - 100.00mA 0 - 40V 50μA ±1.5%
0 - 10.00mA 0 - 40V 5μA ±1.5%
0 - 1.00mA 0 - 40V 0.5μA ±2%
三端穩壓電源集成塊
- 量程范圍 分辨率 誤差
Vo 0 ±28V 0.1V ±2%
Iib 0 ±20mA 1μA ±2%

J型場效應管跨導gm

測試范圍

分辨率

精度

測試條件

0 ～ 99mMHo 0.05mMHo

+/-1%

0 ～ 30V

0 ～ 99μMHo 0.05μMHo

+/-1%

0 ～ 30V

0 ～ 99nMHo 0.05nMHo

+/-2%

0 ～ 30V

Programmable Parametric Tester for Discrete Semiconductors (IST-8800)

  • Tests MOS-FETs, TRIACs, SCRs, Diodes, Transistors, Regulators, Zeners, and J-FETs
    　
  • Performs parametric measurements or Go/No Go tests on over 40 device parameters
    　
  • Built-in relay matrix offers accurate and versatile measurements from the nano amp range up to 1,200V
    　
  • Battery back-up RAM stores user written test routines for "one-time set-up" operation
    　
  • Automatically detects any open, short, or malfunctioning junction of the DUT prior to applying power
    　
  • IEEE-488, High Voltage, and Automatic Handler Interface ports
    　
  • Self calibrating software

The IST-8800 is a fully programmable, low cost tester that provides parameter measurements or parametric GO/NO GO test for transistors, diodes, MOS-FETs, Regulators, Triacs, Zeners, SCRs, and J-FETs. These devices can be tested up to 5 amps or 1200 volts with a measurement range down to the nano amp range. Only four universal test fixtures are required which can test the device across a wide range of packages.

The user-friendly resident software simplifies the operation and programming of the 8800 while the "Quick Set" function provides a means for running fast one-time-test setups. User written routines can be stored in the battery back-up memory for future use. The 8800 is a "Stand Alone" instrument so no additional software, hardware, or special training is required to operate the unit.

The 8800 uses a relay matrix to connect the required test circuits, select the voltage/current sources and establish the needed mesaurement loops. With the auto polarity capability, it identifies the device type (NPS or PNP, P-ch or N-ch) and applies the appropriate circuits to the DUT automatically. The following parameters can be tested:

  • TRANSISTOR: Icbo, Iceo, Iebo, BVcbo, BVebo, BVceo, Bce(sat), Vbe(sat), hFE, Icer, Ices, Icev, BVcer, BVces, BVcev
    　
  • DIODE: Ir, BVr, Vf
    　
  • ZENER DIODE: BVZ, IZR, VZR, VZF
    　
  • J-FET: Idss, Igss, BVgss, gm
    　
  • SCR &TRIAC: +/- Igt, +/- Vgt, Ih
    　
  • VOLTAGE REGULATOR: +/- Vo, +/- Iib, delta V
    　
  • MOS-FET: Idss, Igss, BVdss, Vgs(th)
    　
SPECIFICATIONS:

Dimensions: 4.5" x 17.2" x 16.5" (11.4cm x 43.7cm x 41.9cm
Shipping Weight: 16.0lbs (7.2kg)
Power Requirements: 115VAC or 230VAC 10%, 50 or 60Hz., Approx. 35W
Accessories Furnished: Power cord, instruction manual
Optional accessories:

  1. Test fixture for diode axial lead
    　
  2. Test fixture for TO-220, 218, 202, 237, 126, 92
    　
  3. Test fixture for TO-5, 18, 39, 205 MA
    　
  4. Test fixture for TO-3, 66, 204 MA
    　
  5. High voltage interfact/adaptor for testing up to 1200V

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